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Scanning Electron Microscope (SEM)

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Electron Microscopes (EM) use a beam of accelerated electrons as source to interact with a sample to produce high definition magnified image.


History of Scanning Electron Microscope

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To understand the development of first SEM, it is important to understand the process that evolved in developing the SEM.


Optical Microscope vs Scanning Electron Microscope

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Optical Microscope have been in existence since the 13th century. Earliest compound microscopes are believed to have appeared in 1620 whereas even the first electron microscope.