Scanning Electron Microscope (SEM)
Electron Microscopes (EM) use a beam of accelerated electrons as source to interact with a sample to produce high definition magnified image.
Notification
History of Scanning Electron Microscope
To understand the development of first SEM, it is important to understand the process that evolved in developing the SEM.
Optical Microscope vs Scanning Electron Microscope
Optical Microscope have been in existence since the 13th century. Earliest compound microscopes are believed to have appeared in 1620 whereas even the first electron microscope.